Services

Get to know more about our services

  • STEM-HAADF

    Scanning Transmission Electron Microscopy (STEM) is an invaluable tool for the characterization of nanostructures. It provides elemental composition…

  • Photon Emission

    Photon Emission Microscopy (PEM) or (EMMI) is a high efficient Failure Analysis technique for fault localization on IC's. In principle EMMI or…

  • Failure Analysis Service

    Failure analysis (FA) is the process of determining how or why a part has failed. This is often performed…

  • OBIRCH

    Optical Beam Induced Resistance Change (OBIRCH) is a very powerfull fault localization technique for your Integrated Circuit. In semiconductor Failure…

  • Circuit Edit

    One of the FIB services NanoPhysics has to offer is circuit edit, which is a powerful technique to enhance the development…

  • Chip Deprocessing

    Chip Deprocesing Quite often after Fault Localization like OBIRCH or Photon Emission there it is the need to…

  • High Resolution TEM

    New nanotechnology materials enable scientists to improve bulk physical properties for different applications and, with the resulting products,…

  • SEM-EDX

    Scanning Electron Microscopy (SEM) means a sample surface is scanned with a finely focussed electron beam. The resulting…

  • FIB cross sectioning

    A Focused Ion Beam (FIB) instrument uses a finely focused ion beam to modify and image samples. FIB is chiefly used…