FIB Service Focussed Ion Beam Microscopy

is used for material characterization purposes like cross sectioning, but also for chip circuit modification

Material Analysis Characterizing all kinds of materials

We provide a broad range of microscopy techniques

Reverse Engineering Competitive Insights semiconductor technology

...know your competitor. How do they do it...

Failure Analysis

... how or why a part has failed

FIB techniques

...modify micro-and nanotechnology

Patent Infringement analysis

.....defend your Intellectual Property

Chip Deprocessing

Chip delayering

Competitor Analysis

...know your competitor

Circuit Edit

Modify your IC before change your mask