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Competitor Analysis
Know your competitor! For strategic planning it is crucial to identify opportunities and threats caused by your rivals.…
Failure Analysis Service
Failure analysis (FA) is the process of determining how or why a part has failed. This is often performed…
Patent Infringements analysis
For innovative high-tech companies it is crucial to defend your business. NanoPhysics B.V. can help to reveal detailed…
Circuit Edit
One of the FIB services NanoPhysics has to offer is circuit edit, which is a powerful technique to enhance the development…
Chip Deprocessing
Chip Deprocesing Quite often the next step after Fault Localization like OBIRCH or Photon Emission is Destructive Physical Analysis…
Reverse Engineering
"How it's made?" NanoPhysics B.V. reveals a device's construction, what components are inside and what materials are used.…
SEM-EDX
A powerful technique in Material Analysis is Scanning Electron Microscopy (SEM). Here a sample surface is scanned with a finely…
FIB cross sectioning
A Focused Ion Beam (FIB) instrument uses a finely focused ion beam to modify and image samples. FIB is chiefly used…
