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STEM-HAADF
Scanning Transmission Electron Microscopy (STEM) is an invaluable tool for the characterization of nanostructures. It provides elemental composition…
Photon Emission
Photon Emission Microscopy (PEM) or (EMMI) is a high efficient Failure Analysis technique for fault localization on IC's. In principle EMMI or…
Failure Analysis Service
Failure analysis (FA) is the process of determining how or why a part has failed. This is often performed…
OBIRCH
Optical Beam Induced Resistance Change (OBIRCH) is a very powerfull fault localization technique for your Integrated Circuit. In semiconductor Failure…
Circuit Edit
One of the FIB services NanoPhysics has to offer is circuit edit, which is a powerful technique to enhance the development…
Chip Deprocessing
Chip Deprocesing Quite often the next step after Fault Localization like OBIRCH or Photon Emission is Destructive Physical Analysis…
High Resolution TEM
New nanotechnology materials enable scientists to improve bulk physical properties for different applications and, with the resulting products,…
SEM-EDX
A powerful technique in Material Analysis is Scanning Electron Microscopy (SEM). Here a sample surface is scanned with a finely…
FIB cross sectioning
A Focused Ion Beam (FIB) instrument uses a finely focused ion beam to modify and image samples. FIB is chiefly used…
