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Competitor Analysis
Know your competitor! For strategic planning it is crucial to obtain technology intelligence to identify opportunities and threats.…
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Failure Analysis Service
Failure analysis (FA) is the process of determining how or why a part has failed. This is often performed…
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Patent Infringements analysis
For innovative high-tech companies it is crucial to defend your business. NanoPhysics B.V. can help to reveal detailed…
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Circuit Edit
One of the FIB services NanoPhysics has to offer is circuit edit, which is a powerful technique to enhance the development…
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Chip Deprocessing
Chip Deprocesing Quite often the next step after Fault Localization like OBIRCH or Photon Emission is Destructive Physical Analysis…
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Reverse Engineering
"How it's made?" NanoPhysics B.V. reveals a device's construction, what components are inside and what materials are used.…
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SEM-EDX
A powerful technique in Material Analysis is Scanning Electron Microscopy (SEM). Here a sample surface is scanned with a finely…
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FIB cross sectioning
A Focused Ion Beam (FIB) instrument uses a finely focused ion beam to modify and image samples. FIB is chiefly used…
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